Detection of Shield Inhomogeneities of Muiticonductor Cables under Consideration of the Conductive Environment

Paper #:
  • 1999-01-2328

Published:
  • 1999-06-22
Citation:
Jung, L. and Haseborg, J., "Detection of Shield Inhomogeneities of Muiticonductor Cables under Consideration of the Conductive Environment," SAE Technical Paper 1999-01-2328, 1999, https://doi.org/10.4271/1999-01-2328.
Pages:
6
Abstract:
The determination of the complex transfer impedances and transfer admittances of shielded muiticonductor cables is the prerequisite for calculating disturbing currents on the inner wires of the cable. With a measurement procedure based on the improved triaxial measurement setups using muiticonductor transmission line theory for evaluation, it is possible to determine individual transfer impedances and admittances for each inner conductor of a shielded muiticonductor cable over a broad frequency range [3]. This paper shows the determination of the location and the calculation of the area of shield inhomogeneities by the evaluation of measured transfer impedances and admittances.
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