Identification of Integrated Circuits Conducted Emission Limits for Automotive Applications
Date Published: 2005-04-11
Paper Number:2005-01-0634
DOI: 10.4271/2005-01-0634
Citation:
Musolino, F., Fiori, F., Schinco, F., and De La Pierre, P., "Identification of Integrated Circuits Conducted Emission Limits for Automotive Applications," SAE Technical Paper 2005-01-0634, 2005, doi:10.4271/2005-01-0634.
This paper describes an experimental technique to relate IC conduced emission, as measured by the 1 method (IEC 61967-4), and conducted emission measured by the ground plane method, as described in the CISPR 25 standard. In particular, the maximum limit of IC power supply current spectrum is derived on the basis of emission limits specified in the CISPR 25 document. Such information is useful when defining EMC specifications at IC level.
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