Investigation of the Ta5Si3 and Cr5Si3 Phases by XRD and SEM for Microstructural Characterization 2007-01-2684
In recent studies, much research is focused on the silicides alloys based in refractory transitions metal, becoming these materials as potential candidate for structural applications in high-temperatures for the fact of them possess excellent balance of properties. This work presents results of microstructural characterization of the Ta5Si3 and Cr5Si3 alloys, these silicides were obtained by arc melting under argon atmosphere. X-ray diffraction (XRD) and Scanning Electron Microscope (SEM) were used to obtain information about chemical and crystallographic characteristics of the samples generated before and after the heat-treatment.
Citation: Ribeiro, L., Renosto, S., and Suzuki, P., "Investigation of the Ta5Si3 and Cr5Si3 Phases by XRD and SEM for Microstructural Characterization," SAE Technical Paper 2007-01-2684, 2007, https://doi.org/10.4271/2007-01-2684. Download Citation
Author(s):
Lívia de Souza Ribeiro, Sergio Tuan Renosto, Paulo Atsushi Suzuki
Affiliated:
Universidade de São Paulo - USP Escola de Engenharia de Lorena - Lorena, SP, Brasil
Pages: 8
Event:
SAE Brasil 2007 Congress and Exhibit
ISSN:
0148-7191
e-ISSN:
2688-3627
Related Topics:
Alloys
Chemicals
Metals
Heat treatment
Research and development
SAE MOBILUS
Subscribers can view annotate, and download all of SAE's content.
Learn More »
