Design Curve Construction Based on Two-Stress Level Test Data

Paper #:
  • 2012-01-0069

Published:
  • 2012-04-16
DOI:
  • 10.4271/2012-01-0069
Citation:
Wei, Z., Luo, L., Lin, S., Konson, D. et al., "Design Curve Construction Based on Two-Stress Level Test Data," SAE Technical Paper 2012-01-0069, 2012, doi:10.4271/2012-01-0069.
Pages:
13
Abstract:
A design curve, such as a fatigue design S-N curve, is required in engineering design processes. The design curve is usually constructed by analyzing test data, which often exhibit relatively large scatter. For assumed linear test data, two-stress level test plan is commonly used for accelerated life testing (ALT) and subsequent design curve construction. In this paper, based on the two-stress level test plan, a tolerance limit approach is adopted to develop a simple design curve construction procedure. The predicted results from the new method are compared with that of other methods. The advantage of the new method is demonstrated by analyzing the fatigue S-N test data of exhaust components. The determination of minimum sample size is also discussed with a worked table and a graph.
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