SEM Imaging at Multiple Voltages of Friction Films

Paper #:
  • 2013-01-1220

Published:
  • 2013-04-08
DOI:
  • 10.4271/2013-01-1220
Citation:
Vasconcellos, M. and Hinrichs, R., "SEM Imaging at Multiple Voltages of Friction Films," SAE Technical Paper 2013-01-1220, 2013, https://doi.org/10.4271/2013-01-1220.
Pages:
5
Abstract:
This work proposes to acquire images with multiple electron beam energies in the scanning electron microscope to get more information on the lateral distribution of the carbonaceous layer on the surface of friction films formed in brake couples, by combining the backscattered electron images with the behavior of the intensities of the major characteristic X-ray lines as a function of electron beam energy.
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