An Overview of an Assurance Process of Immunity of Embedded Electronic Systems to Single Event Upsets Caused by Ionizing Particles

Paper #:
  • 2013-36-0535

Published:
  • 2013-10-07
DOI:
  • 10.4271/2013-36-0535
Citation:
Machado, S. and de Oliveira e Souza, M., "An Overview of an Assurance Process of Immunity of Embedded Electronic Systems to Single Event Upsets Caused by Ionizing Particles," SAE Technical Paper 2013-36-0535, 2013, https://doi.org/10.4271/2013-36-0535.
Pages:
7
Abstract:
The aerospace and automotive electronic systems are getting more complex and/or highly integrated, as defined by ARP 4754A, making extensive use of microelectronics and digital memories which, in turn, operates in higher frequencies and lower voltages. In addition, the aircraft are flying in higher altitudes, and polar routes are getting more frequent. These factors raise the probability of occurrence of hazardous effects like the Single Event Upsets in their embedded electronic systems. These must be designed in a way to tolerate and assure the immunity to the Single Event Upsets, based upon criteria such as reliability, availability and criticality. This paper proposes an overview of an assurance process of immunity of embedded electronic systems to Single Event Upsets caused by ionizing particles by means of a review of literature and an analysis of standards as ECSS-E-ST-10-1, NASA Single Event Effects Criticality Analysis and IEC TS 62396-1. This overview intends to contribute to create a process compatible with the Systems Engineering to accommodate the effects of Single Event Upsets caused by the ionizing particles in the aerospace systems projects.
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