Pattern Generation Based Instrument Cluster Virtual Validation

Paper #:
  • 2017-01-1678

Published:
  • 2017-03-28
DOI:
  • 10.4271/2017-01-1678
Citation:
John Selvaraj, J. and Balanayagam, S., "Pattern Generation Based Instrument Cluster Virtual Validation," SAE Technical Paper 2017-01-1678, 2017, doi:10.4271/2017-01-1678.
Pages:
4
Abstract:
Modern Instrument Panel Clusters (IPC) are equipped with thin film transistor (TFT) based displays. Contrary to conventional IPCs with hard gauges and liquid crystal diode (LCD) displays, TFT displays offer versatile usage of display area with soft gauges, reconfigurable menus, tell tales, graphics and warning messages etc., At the same time, the number of possible screen combinations, multicolor images validation and different screen arbitration become significantly complex. Thereby display validation turns out to be a complex and time consuming task in IPC validation. The task becomes even more complex when change requests are to be incorporated during final phases of development stage. This paper provides a novel solution that helps to validate any graphical and behavioral changes with minimum effort and maximum accuracy.
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