Pattern generation based Instrument Cluster virtual validation

Paper #:
  • 2017-01-1678

Published:
  • 2017-03-28
Abstract:
Modern Instrument Panel Clusters (IPC) are equipped with thin film transistor (TFT) based displays. Contrary to conventional IPCs with hard gauges and liquid crystal diode (LCD) displays, TFT displays offer versatile usage of display area with soft gauges, reconfigurable menus, tell tales, graphics and warning messages etc., At the same time, the number of possible screen combinations become huge and thereby display validation turn out to be one of the complex and time consuming tasks in IPC validation. The task becomes even more complex when change requests are to be incorporated during final phases of development stage. This paper provides a novel solution that helps to validate late changes with minimum effort and maximum accuracy.
Access
Now
SAE MOBILUS Subscriber? You may already have access.
Buy
Attention: This item is not yet published. Pre-Order to be notified, via email, when it becomes available.
Select
Price
List
Download
$22.00
Mail
$22.00
Members save up to 36% off list price.
Share
HTML for Linking to Page
Page URL

Related Items

Training / Education
2010-03-15
Standard
1968-01-01
Standard
1987-08-01
Training / Education
2017-03-09
Technical Paper / Journal Article
2004-11-16
Technical Paper / Journal Article
2004-11-16
Technical Paper / Journal Article
2004-11-16
Standard
2014-08-11
Article
2016-03-01