EMC Component Validation Responsibilities encompass many realms. One of these realms is the effect of magnetic fields on silicon-based devices. This paper describes a method for exposing these devices to magnetic fields with waveforms other than the traditional sinusoidal excitation. To explore the sensitivity of test devices (active silicon devices, not just simple wire loops or passive element devices), the method commonly used is to expose the device to a representative sinusoidal field and observe its reaction, or lack thereof. The challenge is to characterize the representative field and be able to verify its effectiveness. Recent vehicle level testing of new designs has brought our attention to time-varying or transient magnetic field shapes that create deviations not previously detected with MIL-STD-461 type sinusoidal magnetic field exposure. A facsimile of a number of existing and well-known vehicle transients are excited through a physical and simulated system to prepare representative and repeatable transient inputs for use with existing lab equipment.