SAFT Nickel-Cadmium Lifetime and Reliability

Paper #:
  • 929327

Published:
  • 1992-08-03
Citation:
Puig, O., "SAFT Nickel-Cadmium Lifetime and Reliability," SAE Technical Paper 929327, 1992, https://doi.org/10.4271/929327.
Author(s):
Pages:
5
Abstract:
The first part of this document gives the reliability number for SAFT cells. This calculation covers the entire SAFT NiCd cell experience: on ground and on board satellites under LEO and GEO conditions. The second part describes a lifetime model. This model is based on a Weibull distribution and the Arrhenius law, taking into account the following parameters: Temperature, DOD, percentage of failed cells and overcharge current.
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