Measurement of Hemispherical Total Emittance in Cryogenic Temperature

Paper #:
  • 941484

Published:
  • 1994-06-01
Citation:
Ohnishi, A., "Measurement of Hemispherical Total Emittance in Cryogenic Temperature," SAE Technical Paper 941484, 1994, https://doi.org/10.4271/941484.
Author(s):
Pages:
6
Abstract:
Measurement of hemispherical total emittance, ε H material for cryogenic engineering in the temperature range of 10∼50K is proposed. This measurement is based on calorimetric method and ε H is obtained by measuring a sample temperature corresponding to heat input to a sample heater. In order to verify this method, the parameter ε H is analyzed for a test chamber by using a thermal mathematical model.
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