Development of Highly Durable IDC Connectors

Paper #:
  • 950302

Published:
  • 1995-02-01
Citation:
Enomoto, K., Gotoh, M., Akashi, K., and Mori, S., "Development of Highly Durable IDC Connectors," SAE Technical Paper 950302, 1995, https://doi.org/10.4271/950302.
Pages:
11
Abstract:
The thermal stresses of various joints between contacts and wire conductors in Insulation Displacement Contact (IDC) connectors were calculated by the finite element method, and the life of each joint was predicted qualitatively. Next, several connectors evaluated well durable at the prediction were subjected to 1,000-hour combined environmental testing. Consequently, a highly reliable IDC connector for automotive applications was developed. Furthermore the predicted life trend of the connectors virtually agreed with the environmental test results.
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