Yield Mapping of Soybeans and Corn Using GPS

Paper #:
  • 952112

Published:
  • 1995-09-01
Citation:
Jenane, C. and Bashford, L., "Yield Mapping of Soybeans and Corn Using GPS," SAE Technical Paper 952112, 1995, https://doi.org/10.4271/952112.
Pages:
10
Abstract:
Data obtained when harvesting with a combine equipped with a yield monitor were used to develop yield maps. A prototype yield monitor was developed that uses a combination of light emitters and receivers mounted in a rectangular frame. The monitor was mounted in the combine in the top of the clean grain elevator. As grain flows through the monitor, a voltage change proportional to light reduction was recorded. This voltage was then correlated to grain flow rate. At the same time, site-specific location was recorded using the global positioning satellites (GPS) system. The location data, yield monitor output, cutting width, and combine forward speed were stored in a spreadsheet format. The data were then used to prepare the yield maps.
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