Measurement of Total Hemispherical Emittance at Cryogenic Temperatures

Paper #:
  • 961430

Published:
  • 1996-07-01
Citation:
Furusawa, T., Nagasaka, Y., and Ohnishi, A., "Measurement of Total Hemispherical Emittance at Cryogenic Temperatures," SAE Technical Paper 961430, 1996, https://doi.org/10.4271/961430.
Pages:
7
Abstract:
A method for measurement of total hemispherical emittance of metals at cryogenic temperatures is described. The principle of the measurement is based on calorimetric method and total hemispherical emittance as a function of temperature is obtained by measuring the equilibrium temperature of a specimen corresponding to different heat input, which is given to a heater attached to the specimen.Measurements of total hemispherical emittance and specific heat have been carried out on the specimen of lead over a temperature range of 10∼40 K. In order to verify the measurement method, uncertainty on heat loss is discussed.
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