“Next Generation” Means for Detecting Squeaks and Rattles in Instrument Panels

Paper #:
  • 972061

Published:
  • 1997-05-20
Citation:
Rusen, W., Peterson, E., McCormick, R., and Byrd, R., "“Next Generation” Means for Detecting Squeaks and Rattles in Instrument Panels," SAE Technical Paper 972061, 1997, https://doi.org/10.4271/972061.
Pages:
6
Abstract:
Engineers doing squeak and rattle testing of instrument panels (IP's) have successfully used large electrodynamic vibration systems to identify sources of squeaks and rattles (S&R's). Their successes led to demands to test more IP's, i.e., to increase throughput of IP's to reflect the many design, material, and/or manufacturing process changes that occur, and to do so at any stage of the development, production, or QA process. What is needed is a radically different and portable way to find S&R's in a fraction of the time and at lower capital cost without compromising S&R detection results.
Access
Now
SAE MOBILUS Subscriber? You may already have access.
Buy
Select
Price
List
Download
$27.00
Mail
$27.00
Members save up to 40% off list price.
Share
HTML for Linking to Page
Page URL

Related Items

Technical Paper / Journal Article
2010-09-28
Training / Education
2018-06-05
Standard
1968-01-01
Training / Education
2018-01-10