Estimation of Spectral Response of Surface Materials through Measurement of Temperature Dependence of Total Hemispherical Emittance

Paper #:
  • 981549

Published:
  • 1998-07-13
Citation:
Hayashi, T., Okamoto, Y., and Ohnishi, A., "Estimation of Spectral Response of Surface Materials through Measurement of Temperature Dependence of Total Hemispherical Emittance," SAE Technical Paper 981549, 1998, https://doi.org/10.4271/981549.
Pages:
7
Abstract:
A method is proposed to estimate a spectral response of surface materials through experimental data of temperature dependence of total hemispherical emittance. This method is applied to experimental data obtained for polyimide films with four different kinds of thickness, and the results of their spectral response estimated are shown.
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