Estimation of Spectral Response of Surface Materials through Measurement of Temperature Dependence of Total Hemispherical Emittance

Date Published: 1998-07-13

Paper Number: 981549

DOI: 10.4271/981549

Citation:

Hayashi, T., Okamoto, Y., and Ohnishi, A., "Estimation of Spectral Response of Surface Materials through Measurement of Temperature Dependence of Total Hemispherical Emittance," SAE Technical Paper 981549, 1998, doi:10.4271/981549.

Author(s):

Tomonao Hayashi - Chiba Institute of Technology
Yoshiwo Okamoto - Chiba Institute of Technology
Akira Ohnishi - Institute of Space and Astronautical Science

Abstract:

A method is proposed to estimate a spectral response of surface materials through experimental data of temperature dependence of total hemispherical emittance. This method is applied to experimental data obtained for polyimide films with four different kinds of thickness, and the results of their spectral response estimated are shown.

File Size: 216K

Product Status: In Stock

See papers presented at International Conference On Environmental Systems, July 1998, Danvers, MA, USA, Session: Unmanned Spacecraft Thermal Design and Technology

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