Technical Paper
Investigation to Develop Optimum Short-Term Screen Tests for Integrated Circuits
1967-02-01
670610
The techniques of device manufacturing control and screen testing employed today allows an escape rate of latent defects which makes probability of mission success of a manned interplanetary mission questionable. The increased system complexity and mission duration underscore the need to establish maximum integrated circuit reliability and a test sequence to prove that it exists. This paper describes a technique of utilizing life distributions of Integrated circuits obtained under high-stress testing to establish reliability screening criteria. Discussed are the basic factors controlling observable lot behavior, what can be learned from them, and how they dictate a test approach. Analyzed are the typical life expectancy distributions obtainable from today's devices; what the probable escape rates of defective devices are; how they may be made observable; and finally, how the expected life of accepted devices may be altered by stress screening.